ELDIM

Optical device allowing rapid measurement of angular emission pattern of limited area light source

N° CN115151797A

한정된 영역의 광원의 각도 방사 패턴을 빠르게 측정할 수 있는 광학 장치

N° KR20220147647A

OPTISCHE VORRICHTUNG ZUR SCHNELLEN MESSUNG DER WINKELEMISSION EINER LICHTQUELLE FINITER FLÄCHE

N° DE112021001302T5

OPTICAL DEVICE ALLOWING THE ANGULAR EMISSION PATTERN OF A LIGHT SOURCE OF FINITE AREA TO BE RAPIDLY MEASURED

N° WO2021170960A1

OPTICAL DEVICE ALLOWING THE ANGULAR EMISSION PATTERN OF A LIGHT SOURCE OF FINITE AREA TO BE RAPIDLY MEASURED

N° US2023117589A1

Dispositif optique permettant de mesurer rapidement l’émission angulaire d’une source de lumière de surface finie

N° FR3107766A1

OPTICAL DEVICE ALLOWING THE ANGULAR AND SPECTRAL EMISSION OF AN OBJECT TO BE MEASURED SIMULTANEOUSLY

N° WO2019186082A1

Optical device allowing the angular and spectral emission of an object to be measured simultaneously

N° US2021172802A1

Optical device allowing angular and spectral emission of object to be measured simultaneously

N° CN112041645A

물체의 각도 및 분광 방출의 동시 측정이 가능한 광학 장치

N° KR20200136032A

OPTICAL DEVICE ALLOWING THE ANGULAR AND SPECTRAL EMISSION OF AN OBJECT TO BE MEASURED SIMULTANEOUSLY

N° EP3775807A1

DISPOSITIF OPTIQUE PERMETTANT DE MESURER SIMULTANEMENT L'EMISSION ANGULAIRE ET SPECTRALE D'UN OBJET

N° FR3079612A1